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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
Comprises an LCD display and a detachable detector/drive unit. Parameters measured in Ra, Rq, Ry, Rz, Rt, Rp, R3z, Rk, Rpk, Rvk, S, Sm, Pc,..
The Olympus 38DL Plus Ultrasonic Thickness Gauge performs non-destructive measurements. This unit is supplied with transducers that can meas..
DC Porosity (Holiday) detector. Detects pinholes in coatings above 150um on metal substrates such as pipes and tanks. 0-30kV, 3.5 digit L..
Pulse porosity (Holiday) detector. Detects pinholes in coatings and wrapping above 150µm on metal substrates such as pipes and tanks. Can..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis